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[IEEE 11th International Conference on Ion Implantation Technology - Austin, TX, USA (16-21 June 1996)] Proceedings of 11th International Conference on Ion Implantation Technology - Understanding implant damage by implant channeling profile measurements
Packan, P., Kennel, H., Thompson, S., Corcoran, S., Taylor, M.Year:
1997
Language:
english
DOI:
10.1109/iit.1996.586436
File:
PDF, 358 KB
english, 1997