[IEEE 35th IEEE Applied Imagery and Pattern Recognition...

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[IEEE 35th IEEE Applied Imagery and Pattern Recognition Workshop (AIPR'06) - Washington, DC, USA (2006.10.11-2006.10.13)] 35th IEEE Applied Imagery and Pattern Recognition Workshop (AIPR'06) - An Image Metric-Based ATR Performance Prediction Testbed

Ralph, Scott K., Irvine, John, Snorrason, Magnus, Vanstone, Steve
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Year:
2006
Language:
english
DOI:
10.1109/aipr.2006.13
File:
PDF, 724 KB
english, 2006
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