[IEEE 2012 International Conference on Quality, Reliability, Risk, Maintenance, and Safety Engineering (QR2MSE) - Chengdu, China (2012.06.15-2012.06.18)] 2012 International Conference on Quality, Reliability, Risk, Maintenance, and Safety Engineering - Design of bending test system for silicon micro-beam
Liu, Bin, Tao, Junyong, Zhang, Yun'an, Chen, XunYear:
2012
Language:
english
DOI:
10.1109/icqr2mse.2012.6246405
File:
PDF, 1.39 MB
english, 2012