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[IEEE 2008 IEEE Instrumentation and Measurement Technology Conference - I2MTC 2008 - Victoria, BC, Canada (2008.05.12-2008.05.15)] 2008 IEEE Instrumentation and Measurement Technology Conference - Intelligent Texture Alignment for Kimono Design
Sano, Tetsuya, Ukida, Hiroyuki, Yamamoto, HidekiYear:
2008
Language:
english
DOI:
10.1109/imtc.2008.4547043
File:
PDF, 2.05 MB
english, 2008