{311} defects in silicon: The source of the loops

Applied Physics Letters 1998 Vol. 73; Iss. 25

{311} defects in silicon: The source of the loops

Li, Jinghong, Jones, Kevin S.
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Volume:
73
Year:
1998
Language:
english
Journal:
Applied Physics Letters
DOI:
10.1063/1.122882
File:
PDF, 399 KB
english, 1998
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