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Quantitative analysis of Cu implanted Co/Ni alloys by Auger electron spectroscopy/depth profiling using factor analysis
Wandass, J. H.Volume:
6
Language:
english
Journal:
Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films
DOI:
10.1116/1.575625
Date:
May, 1988
File:
PDF, 790 KB
english, 1988