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Temperature dependence of the picosecond carrier relaxation in silicon-irradiated silicon-on-sapphire films
Pfeiffer, Th., Kuhl, J., Göbel, E. O., Palmetshofer, L.Volume:
62
Year:
1987
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.339568
File:
PDF, 684 KB
english, 1987