[IEEE 2011 IEEE International Reliability Physics Symposium (IRPS) - Monterey, CA, USA (2011.04.10-2011.04.14)] 2011 International Reliability Physics Symposium - Low-frequency noise behavior of La-doped HfSiON/metal gate nMOSFETs
Choi, Do-Young, Park, Min Sang, Sohn, Chang Woo, Sagong, Hyun Chul, Jung, Eui-Young, Lee, Jeong-Soo, Jeong, Yoon-Ha, Kang, Chang YongYear:
2011
Language:
english
DOI:
10.1109/irps.2011.5784602
File:
PDF, 356 KB
english, 2011