Improved high-temperature switching characteristics of Y 2 O 3 /TiO x resistive memory through carrier depletion effect
Zheng, Zhi-Wei, Hsu, Hsiao-Hsuan, Cheng, Chun-Hu, Chen, Po-ChunVolume:
8
Language:
english
Journal:
physica status solidi (RRL) - Rapid Research Letters
DOI:
10.1002/pssr.201409039
Date:
May, 2014
File:
PDF, 511 KB
english, 2014