![](/img/cover-not-exists.png)
[IEEE 2011 International Conference on Mechatronic Science, Electric Engineering and Computer (MEC) - Jilin, China (2011.08.19-2011.08.22)] 2011 International Conference on Mechatronic Science, Electric Engineering and Computer (MEC) - An improved algorithm of multiple pattern matching
Liu, Yunan, Wang, Yongwei, Bian, Li, Xie, WenchongYear:
2011
Language:
english
DOI:
10.1109/mec.2011.6025796
File:
PDF, 259 KB
english, 2011