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[IEEE 2006 IEEE International High Level Design Validation and Test Workshop - Monterey, CA, USA (2006.11.8-2006.11.10)] 2006 IEEE International High Level Design Validation and Test Workshop - Practical Issues in Sequential Equivalence Checking through Alignability: Handling Don't Cares and Generating Debug Traces
Moon, In-ho, Bjesse, Per, Pixley, CarlYear:
2006
Language:
english
DOI:
10.1109/hldvt.2006.319985
File:
PDF, 6.68 MB
english, 2006