[IEEE 2013 20th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) - Suzhou, China (2013.07.15-2013.07.19)] Proceedings of the 20th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) - HV PMOSFET Vth (threshold voltage) shift caused by HEIP after HTOL
Lee Kyenam,, Jang Hyunho,, Kim Kihyun,, Park Jeonghyeon,, Byunghoon Lee,, Seo Ulkyu,, Kim Byungsub,Year:
2013
DOI:
10.1109/ipfa.2013.6599250
File:
PDF, 339 KB
2013