The orientation dependent electromigration induced healing...

The orientation dependent electromigration induced healing on the surface cracks and roughness caused by the uniaxial compressive stresses in single crystal metallic thin films

Ogurtani, Tarik Omer
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Volume:
106
Year:
2009
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.3211855
File:
PDF, 1.58 MB
english, 2009
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