Reflectometer end station for synchrotron calibrations of Advanced X-ray Astrophysics Facility flight optics and for spectrometric research applications
Graessle, D. E., Fitch, J. J., Ingram, R., Zhang Juda, J., Blake, R. L.Volume:
66
Year:
1995
Language:
english
Journal:
Review of Scientific Instruments
DOI:
10.1063/1.1145739
File:
PDF, 747 KB
english, 1995