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A simple model for the Auger electron spectroscopy evaluation of thin-film layer growth systems in which substrate–overgrowth atom mixing occurs
Ece, M.Volume:
6
Language:
english
Journal:
Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films
DOI:
10.1116/1.575627
Date:
May, 1988
File:
PDF, 636 KB
english, 1988