Analysis of the strain profile in thin Au/Ni multilayers by...

Analysis of the strain profile in thin Au/Ni multilayers by x-ray diffraction

Chaudhuri, J., Gondhalekar, V., Jankowski, A. F.
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Volume:
71
Year:
1992
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.350896
File:
PDF, 720 KB
english, 1992
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