[IEEE 2012 24th International Conference on Microelectronics (ICM) - Algiers, Algeria (2012.12.16-2012.12.20)] 2012 24th International Conference on Microelectronics (ICM) - New approach for modeling effect of phosphorous diffusion on minority carrier lifetime in multicrystalline silicon wafers
Soleimany, Bentalhoda, Hashemi, Anahita Shojai, Asl-Soleimani, EbrahimYear:
2012
Language:
english
DOI:
10.1109/icm.2012.6471403
File:
PDF, 252 KB
english, 2012