[IEEE Conference on Precision Electromagnetic Measurements - Ibaraki, Japan (1990.06.11-1990.06.14)] Conference on Precision Electromagnetic Measurements - Scanning Tunneling Microscopy of the Si-Mosfet Used for Quantized Hall Resistance Measurements
Khaikin,, Edel'man,, Troyanovskii,, Pudalov,, Semenchinsky,Year:
1988
Language:
english
DOI:
10.1109/cpem.1988.671324
File:
PDF, 198 KB
english, 1988