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Analysis of surface oxides of gas-evaporated Si small particles with infrared spectroscopy, high-resolution electron microscopy, and x-ray photoemission spectroscopy
Hayashi, Shinji, Tanimoto, Shinichi, Yamamoto, KeiichiVolume:
68
Year:
1990
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.347022
File:
PDF, 1.38 MB
english, 1990