Analysis of surface oxides of gas-evaporated Si small...

Analysis of surface oxides of gas-evaporated Si small particles with infrared spectroscopy, high-resolution electron microscopy, and x-ray photoemission spectroscopy

Hayashi, Shinji, Tanimoto, Shinichi, Yamamoto, Keiichi
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
68
Year:
1990
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.347022
File:
PDF, 1.38 MB
english, 1990
Conversion to is in progress
Conversion to is failed