A DFT study on the electronic and redox properties of [X...

Canadian Journal of Chemistry 2010 / 05 Vol. 88; Iss. 5

A DFT study on the electronic and redox properties of [X 8 V 14 O 50 ] n – (X = Si IV , Ge IV , P V , and As V )

Janjua, Muhammad Ramzan Saeed Ashraf, Su, Zhong-Min, Guan, Wei, Irfan, Ahmad, Muhammad, Shabbir, Iqbal, Mudassir
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Volume:
88
Language:
english
Journal:
Canadian Journal of Chemistry
DOI:
10.1139/v10-019
Date:
May, 2010
File:
PDF, 2.04 MB
english, 2010
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