Reply to ‘‘Comments on ‘Measurements of minority-carrier diffusion length in n-CuInSe2 by electron-beam-induced current method’ ’’ [J. Appl. Phys. 66, 5412 (1989)]
Scheer, R., Lewerenz, H. J.Volume:
68
Year:
1990
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.346296
File:
PDF, 373 KB
english, 1990