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[IEEE 2013 IEEE Conference on Electrical Insulation and Dielectric Phenomena - (CEIDP 2013) - Chenzhen, China (2013.10.20-2013.10.23)] 2013 Annual Report Conference on Electrical Insulation and Dielectric Phenomena - Dielectric breakdown and morphological evolution of PTFE during thermal-oxidative ageing at temperatures lower and higher than the melting temperature

Huang, X., Martinez-Vega, J., Malec, D.
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Year:
2013
Language:
english
DOI:
10.1109/ceidp.2013.6748189
File:
PDF, 1001 KB
english, 2013
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