Interfacial roughness correlation in multilayer films: Influence of total film and individual layer thicknesses
Savage, D. E., Schimke, N., Phang, Y.-H., Lagally, M. G.Volume:
71
Year:
1992
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.350976
File:
PDF, 1.65 MB
english, 1992