Combining Near-Field Scanning Microwave Microscopy With...

IEEE Transactions on Appiled Superconductivity 2007 / 06 Vol. 17; Iss. 2

Combining Near-Field Scanning Microwave Microscopy With Transport Measurement for Imaging Current-Obstructing Defects in HTS Films

Dizon, Jonathan R., Wang, Xiang, Aga, Roberto S., Wu, Judy Z.
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Volume:
17
Language:
english
Journal:
IEEE Transactions on Applied Superconductivity
DOI:
10.1109/tasc.2007.899569
Date:
June, 2007
File:
PDF, 296 KB
english, 2007
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