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Hall-effect characterization in semiconductor heterostructure junctions using polarized laser signal
How, Hoton, Fang, Ta-Ming, Lu, Feng, Ahern, BrianVolume:
79
Year:
1996
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.361663
File:
PDF, 345 KB
english, 1996