Ultrahigh-vacuum four-circle diffractometer for grazing...

Review of Scientific Instruments 1989 Vol. 60; Iss. 7

Ultrahigh-vacuum four-circle diffractometer for grazing incidence x-ray diffraction on in situ MBE grown III-V semiconductor surfaces

Claverie, P., Massies, J., Pinchaux, R., Sauvage-Simkin, M., Frouin, J., Bonnet, J., Jedrecy, N.
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Volume:
60
Year:
1989
Language:
english
Journal:
Review of Scientific Instruments
DOI:
10.1063/1.1140722
File:
PDF, 683 KB
english, 1989
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