[IEEE 2013 IEEE 63rd Electronic Components and Technology Conference (ECTC) - Las Vegas, NV, USA (2013.05.28-2013.05.31)] 2013 IEEE 63rd Electronic Components and Technology Conference - A new and effective drop test evolution to next-gen handheld applications
Xie, Dongji, Hsu, Ife, Zhou, Yingliang, Zhang, Andy, Woo, Min, Uppalapati, Ramgopal, Wu, Zhongming, McMullen, TomYear:
2013
Language:
english
DOI:
10.1109/ectc.2013.6575737
File:
PDF, 1.33 MB
english, 2013