[IEEE 2010 20th International Conference on Pattern Recognition (ICPR) - Istanbul, Turkey (2010.08.23-2010.08.26)] 2010 20th International Conference on Pattern Recognition - Image Specific Error Rate: A Biometric Performance Metric
Tabassi, ElhamYear:
2010
Language:
english
DOI:
10.1109/icpr.2010.281
File:
PDF, 1.18 MB
english, 2010