Scattering of electrons in silicon inversion layers by...

Scattering of electrons in silicon inversion layers by remote surface roughness

Gámiz, F., Roldán, J. B.
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Volume:
94
Year:
2003
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.1577227
File:
PDF, 406 KB
english, 2003
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