[IEEE 2010 20th International Conference on Pattern Recognition (ICPR) - Istanbul, Turkey (2010.08.23-2010.08.26)] 2010 20th International Conference on Pattern Recognition - Intensity-Based Congealing for Unsupervised Joint Image Alignment
Storer, Markus, Urschler, Martin, Bischof, HorstYear:
2010
Language:
english
DOI:
10.1109/icpr.2010.364
File:
PDF, 957 KB
english, 2010