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[IEEE 2008 IEEE AUTOTESTCON - Salt Lake City, UT, USA (2008.09.8-2008.09.11)] 2008 IEEE AUTOTESTCON - Fault detection and visualization through micron-resolution X-ray imaging
Cicchiani, John A., Hartmuller, Tricia L., Sell, Chris M., Wright, R. GlennYear:
2008
Language:
english
DOI:
10.1109/autest.2008.4662635
File:
PDF, 4.61 MB
english, 2008