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[IEEE IC's (ISPSD) - San Diego, CA, USA (2011.05.23-2011.05.26)] 2011 IEEE 23rd International Symposium on Power Semiconductor Devices and ICs - Solutions to improve flatness of Id-Vd curves of rugged nLDMOS

Mouhoubi, S., Bauwens, F., Roig, J., Gassot, P., Moens, P., Tack, M.
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Year:
2011
Language:
english
DOI:
10.1109/ispsd.2011.5890825
File:
PDF, 1.02 MB
english, 2011
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