Synchrotron radiation-based far-infrared spectroscopic ellipsometer with full Mueller-matrix capability
Stanislavchuk, T. N., Kang, T. D., Rogers, P. D., Standard, E. C., Basistyy, R., Kotelyanskii, A. M., Nita, G., Zhou, T., Carr, G. L., Kotelyanskii, M., Sirenko, A. A.Volume:
84
Year:
2013
Language:
english
Journal:
Review of Scientific Instruments
DOI:
10.1063/1.4789495
File:
PDF, 2.06 MB
english, 2013