Self-limiting behavior of scanning-electron-beam-induced...

Self-limiting behavior of scanning-electron-beam-induced local oxidation of hydrogen-passivated silicon surfaces

Wei, Y. Y., Eres, Gyula
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Volume:
76
Year:
2000
Language:
english
Journal:
Applied Physics Letters
DOI:
10.1063/1.125700
File:
PDF, 406 KB
english, 2000
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