[IEEE 1993 IEEE International Symposium on Circuits and Systems - Chicago, IL, USA (3-6 May 1993)] 1993 IEEE International Symposium on Circuits and Systems - Generic face recognition, feature extraction and edge detection using optimal DSNR expansion matching
Rao, K.R., Ben-Arie, J.Year:
1993
Language:
english
DOI:
10.1109/iscas.1993.393779
File:
PDF, 398 KB
english, 1993