[IEEE 2006 IEEE Instrumentation and Measurement Technology - Sorrento, Italy (2006.04.24-2006.04.27)] 2006 IEEE Instrumentation and Measurement Technology Conference Proceedings - A Bandwidth Extension Technique for Dynamic Characterization of Power Amplifiers
Wisell, David, Ronnow, Daniel, Handel, PeterYear:
2006
Language:
english
DOI:
10.1109/imtc.2006.328389
File:
PDF, 150 KB
english, 2006