Sensitive measurement of magnetostriction effects in thin films by means of a two-beam free-sample deflection method
Brückner, W., Lang, C., Schneider, C. M.Volume:
72
Year:
2001
Language:
english
Journal:
Review of Scientific Instruments
DOI:
10.1063/1.1362436
File:
PDF, 317 KB
english, 2001