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Structural defects in self-assembled organic monolayers via combined atomic beam and x-ray diffraction
Camillone, N., Chidsey, C. E. D., Eisenberger, P., Fenter, P., Li, J., Liang, K. S., Liu, G.-Y., Scoles, G.Volume:
99
Year:
1993
Language:
english
Journal:
The Journal of Chemical Physics
DOI:
10.1063/1.465749
File:
PDF, 608 KB
english, 1993