Flash Memory Under Cosmic and Alpha Irradiation

IEEE Transactions on Device and Materials Reliability 2004 / 09 Vol. 4; Iss. 3

Flash Memory Under Cosmic and Alpha Irradiation

Fogle, A.D., Darling, D., BlishII, R.C., Daszko, E.
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Volume:
4
Language:
english
Journal:
IEEE Transactions on Device and Materials Reliability
DOI:
10.1109/tdmr.2004.834054
Date:
September, 2004
File:
PDF, 407 KB
english, 2004
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