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[IEEE 2004 IEEE International Reliability Physics Symposium. - Phoenix, AZ, USA (25-29 April 2004)] 2004 IEEE International Reliability Physics Symposium. Proceedings - Reliability properties of low voltage PZT ferroelectric capacitors and arrays
Rodriguez, J., Remack, K., Boku, K., Udayakumar, K.R., Aggarwal, S., Summerfelt, S., Moise, T., McAdams, H., McPherson, J., Bailey, R., Depner, M., Fox, G.Year:
2004
Language:
english
DOI:
10.1109/relphy.2004.1315324
File:
PDF, 616 KB
english, 2004