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Scanning tunneling microscopy studies of oxide growth and etching on Si(5 5 12)
Skrobiszewski, J. L., Moore, J. C., Dickinson, J. W., Baski, A. A.Volume:
22
Year:
2004
Language:
english
Journal:
Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films
DOI:
10.1116/1.1760750
File:
PDF, 928 KB
english, 2004