Thickness and conductivity of metallic layers from pulsed...

Review of Scientific Instruments 1996 Vol. 67; Iss. 11

Thickness and conductivity of metallic layers from pulsed eddy-current measurements

Tai, Cheng-Chi, Rose, James H., Moulder, John C.
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Volume:
67
Year:
1996
Language:
english
Journal:
Review of Scientific Instruments
DOI:
10.1063/1.1147300
File:
PDF, 539 KB
english, 1996
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