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[IEEE 2010 IEEE International Conference on Imaging Systems and Techniques (IST) - Thessaloniki, Greece (2010.07.1-2010.07.2)] 2010 IEEE International Conference on Imaging Systems and Techniques - Geometric distortion correction for sinusoidally scanned atomic force microscopic images
Tian, Xiangrui, Xu, Lijun, Li, Xiaolu, Shang, Guangyi, Yao, JunenYear:
2010
Language:
english
DOI:
10.1109/ist.2010.5548513
File:
PDF, 180 KB
english, 2010