Structural and chemical analysis of ion beam produced conductive regions on highly resistive organic films
Venkatesan, T., Forrest, S. R., Kaplan, M. L., Schmidt, P. H., Murray, C. A., Brown, W. L., Wilkens, B. J., Roberts, R. F., Rupp, L., Schonhorn, H.Volume:
56
Year:
1984
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.333809
File:
PDF, 984 KB
english, 1984