![](/img/cover-not-exists.png)
[IEEE 2009 16th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) - Suzhou, Jiangsu, China (2009.07.6-2009.07.10)] 2009 16th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits - Anomalous “sweeping stress” induced degradation in n-type low temperature poly-Si thin film transistors
Zhou, Dapeng, Wang, Mingxiang, Zhang, Meng, Hao, Han, Zhang, Dongli, Wong, ManYear:
2009
Language:
english
DOI:
10.1109/ipfa.2009.5232717
File:
PDF, 5.69 MB
english, 2009