[IEEE 2010 IEEE Instrumentation & Measurement Technology Conference Proceedings - Austin, TX, USA (2010.05.3-2010.05.6)] 2010 IEEE Instrumentation & Measurement Technology Conference Proceedings - Master-slave dual readers enhanced aloha anti-collision mechanism for dense active RFID
Sun, Qunying, Zhang, Hongjian, Mo, LingfeiYear:
2010
Language:
english
DOI:
10.1109/imtc.2010.5488278
File:
PDF, 631 KB
english, 2010