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[IEEE 2010 IEEE Instrumentation & Measurement Technology Conference Proceedings - Austin, TX, USA (2010.05.3-2010.05.6)] 2010 IEEE Instrumentation & Measurement Technology Conference Proceedings - Master-slave dual readers enhanced aloha anti-collision mechanism for dense active RFID

Sun, Qunying, Zhang, Hongjian, Mo, Lingfei
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Year:
2010
Language:
english
DOI:
10.1109/imtc.2010.5488278
File:
PDF, 631 KB
english, 2010
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