Preparation, morphology, and gas-sensing behavior of Cr/sub 2-x/Ti/sub x/O/sub 3+z/ thin films on standard silicon wafers
Wollenstein, J., Plescher, G., Kuhner, G., Bottner, H., Niemeyer, D., Williams, D.E.Volume:
2
Language:
english
Journal:
IEEE Sensors Journal
DOI:
10.1109/jsen.2002.804578
Date:
October, 2002
File:
PDF, 1012 KB
english, 2002