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[Int. Test Conference 1995 IEEE International Test Conference (ITC) - Washington, DC, USA (21-25 Oct. 1995)] Proceedings of 1995 IEEE International Test Conference (ITC) - A low-cost high-performance CMOS timing vernier for ATE
Chapman, J., Currin, J., Payne, S.Year:
1995
Language:
english
DOI:
10.1109/test.1995.529873
File:
PDF, 652 KB
english, 1995