![](/img/cover-not-exists.png)
Degradation mechanisms of organic ferroelectric field-effect transistors used as nonvolatile memory
Ng, Tse Nga, Russo, Beverly, Arias, Ana ClaudiaVolume:
106
Year:
2009
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.3253758
File:
PDF, 614 KB
english, 2009