Utilization of high speed x-ray topography for determining...

Review of Scientific Instruments 1989 Vol. 60; Iss. 7

Utilization of high speed x-ray topography for determining diffusion coefficients of point defects in nearly perfect crystals

Hondoh, T., Goto, A., Hoshi, R., Ono, T., Anzai, H., Kawase, R., Pimienta, P., Mae, S.
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Volume:
60
Year:
1989
Language:
english
Journal:
Review of Scientific Instruments
DOI:
10.1063/1.1140708
File:
PDF, 660 KB
english, 1989
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